DocumentCode :
254615
Title :
Edge-Weighted Centroid Voronoi Tessellation with Propagation of Consistency Constraint for 3D Grain Segmentation in Microscopic Superalloy Images
Author :
Youjie Zhou ; Lili Ju ; Yu Cao ; Waggoner, Jarrell ; Yuewei Lin ; Simmons, Jeff ; Song Wang
Author_Institution :
Dept. of Comput. Sci. & Eng., Univ. of South Carolina, Columbia, SC, USA
fYear :
2014
fDate :
23-28 June 2014
Firstpage :
258
Lastpage :
265
Abstract :
3D microstructures are important for material scientists to analyze physical properties of materials. While such microstructures are too small to be directly visible to human vision, modern microscopic and serial-sectioning techniques can provide their high-resolution 3D images in the form of a sequence of 2D image slices. In this paper, we propose an algorithm based on the Edge-Weighted Centroid Voronoi Tessellation which uses propagation of the inter-slice consistency constraint. It can segment a 3D superalloy image, slice by slice, to obtain the underlying grain microstructures. With the propagation of the consistency constraint, the proposed method can automatically match grain segments between slices. On each of the 2D image slices, stable structures identified from the previous slice can be well-preserved, with further refinement by clustering the pixels in terms of both intensity and spatial information. We tested the proposed algorithm on a 3D superalloy image consisting of 170 2D slices. Performance is evaluated against manually annotated ground-truth segmentation. The results show that the proposed method outperforms several state-of-the-art 2D, 3D, and propagation-based segmentation methods in terms of both segmentation accuracy and running time.
Keywords :
computational geometry; constraint handling; crystal microstructure; image matching; image segmentation; materials science computing; superalloys; 3D grain segmentation; edge-weighted centroid Voronoi tessellation; grain microstructures; grain segment matching; inter-slice consistency constraint propagation; material scientists; microscopic superalloy images; pixel clustering; Clustering algorithms; Image edge detection; Image segmentation; Indexes; Silicon; Three-dimensional displays; 3D image segmentation; centroidal Voronoi tessellation; grain segmentation; segmentation propagation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Vision and Pattern Recognition Workshops (CVPRW), 2014 IEEE Conference on
Conference_Location :
Columbus, OH
Type :
conf
DOI :
10.1109/CVPRW.2014.47
Filename :
6909992
Link To Document :
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