• DocumentCode
    254615
  • Title

    Edge-Weighted Centroid Voronoi Tessellation with Propagation of Consistency Constraint for 3D Grain Segmentation in Microscopic Superalloy Images

  • Author

    Youjie Zhou ; Lili Ju ; Yu Cao ; Waggoner, Jarrell ; Yuewei Lin ; Simmons, Jeff ; Song Wang

  • Author_Institution
    Dept. of Comput. Sci. & Eng., Univ. of South Carolina, Columbia, SC, USA
  • fYear
    2014
  • fDate
    23-28 June 2014
  • Firstpage
    258
  • Lastpage
    265
  • Abstract
    3D microstructures are important for material scientists to analyze physical properties of materials. While such microstructures are too small to be directly visible to human vision, modern microscopic and serial-sectioning techniques can provide their high-resolution 3D images in the form of a sequence of 2D image slices. In this paper, we propose an algorithm based on the Edge-Weighted Centroid Voronoi Tessellation which uses propagation of the inter-slice consistency constraint. It can segment a 3D superalloy image, slice by slice, to obtain the underlying grain microstructures. With the propagation of the consistency constraint, the proposed method can automatically match grain segments between slices. On each of the 2D image slices, stable structures identified from the previous slice can be well-preserved, with further refinement by clustering the pixels in terms of both intensity and spatial information. We tested the proposed algorithm on a 3D superalloy image consisting of 170 2D slices. Performance is evaluated against manually annotated ground-truth segmentation. The results show that the proposed method outperforms several state-of-the-art 2D, 3D, and propagation-based segmentation methods in terms of both segmentation accuracy and running time.
  • Keywords
    computational geometry; constraint handling; crystal microstructure; image matching; image segmentation; materials science computing; superalloys; 3D grain segmentation; edge-weighted centroid Voronoi tessellation; grain microstructures; grain segment matching; inter-slice consistency constraint propagation; material scientists; microscopic superalloy images; pixel clustering; Clustering algorithms; Image edge detection; Image segmentation; Indexes; Silicon; Three-dimensional displays; 3D image segmentation; centroidal Voronoi tessellation; grain segmentation; segmentation propagation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision and Pattern Recognition Workshops (CVPRW), 2014 IEEE Conference on
  • Conference_Location
    Columbus, OH
  • Type

    conf

  • DOI
    10.1109/CVPRW.2014.47
  • Filename
    6909992