DocumentCode
2546402
Title
Application of a post-processing model based on HMM for face recognition in video
Author
Qiu, Kaijin ; Xiao, Guoqiang ; Dai, Yi
Author_Institution
Coll. of Comput. & Inf. Sci., Southwest Univ., Chongqing, China
fYear
2010
fDate
16-18 April 2010
Firstpage
15
Lastpage
19
Abstract
In this thesis, the rarely concerned problem of data source in face recognition is investigated, and a novel post processing HMM-based solution is proposed. Data source problem is first empirically investigated through evaluating systematically the Eigenfaces sensitivity to variations of pose and illumination by Lambertian reflection model and 3D face model, which reveals that the changes of pose and illumination abruptly degrade the Eigenfaces system. This problem is explicitly defined as curse of data source for highlighting its significance. Aiming at solving this problem, combining the recognition rate with the analysis of the data sources, two methods is proposed to evaluate the overall performance of specific face recognition approach with its robustness against the low-quality data sources considered. Finally, a post-processing method is proposed to improve the robustness of the recognizer under unconstrained environment. Experimental results have impressively indicated the effectiveness of the proposed post-processing solution to tackle the curse of data source problem.
Keywords
face recognition; hidden Markov models; lighting; pose estimation; video signal processing; 3D face model; Lambertian reflection model; data source problem; eigenfaces system; face recognition; hidden Markov model; illumination variation; pose variation; post-processing model; video sequences; Data analysis; Face detection; Face recognition; Hidden Markov models; Image analysis; Image reconstruction; Lighting; Performance analysis; Reflection; Robustness; Face Recognition; HMM; Post-processing; confusion matrix; curse of data source;
fLanguage
English
Publisher
ieee
Conference_Titel
Information Management and Engineering (ICIME), 2010 The 2nd IEEE International Conference on
Conference_Location
Chengdu
Print_ISBN
978-1-4244-5263-7
Electronic_ISBN
978-1-4244-5265-1
Type
conf
DOI
10.1109/ICIME.2010.5477735
Filename
5477735
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