Title :
Implementing multi-gigahertz test systems using CMOS FPGAs and PECL components
Author :
Keezer, David ; Gray, Carl ; Majid, Ashraf ; Taher, Nafeez
Author_Institution :
Georgia Inst. of Technol., Sch. of Electr. & Comput. Eng., Atlanta, GA, USA
Abstract :
Two research projects are described that develop low-cost techniques for testing multi-gigahertz devices. Each project uses commercially available components to keep costs low, and achieves performance characteristics comparable to (and in some ways exceeding) more expensive ATE. An FPGA-based logic core provides flexibility, adaptability, and communication with controlling computers while customized emitter-coupled logic achieves multi-gigahertz data rates with about ±25ps timing accuracy. This paper has been adapted from (Keezer, 2005).
Keywords :
CMOS integrated circuits; automatic test equipment; field programmable gate arrays; logic testing; CMOS FPGA components; FPGA-based logic core; PECL components; automatic test equipment; emitter-coupled logic; multigigahertz data rates; multigigahertz devices; multigigahertz test systems; Automatic testing; Circuit testing; Clocks; Field programmable gate arrays; Logic devices; Logic testing; Radio frequency; System testing; Timing; Universal Serial Bus;
Conference_Titel :
Solid-State Circuits Conference, 2005. ESSCIRC 2005. Proceedings of the 31st European
Print_ISBN :
0-7803-9205-1
DOI :
10.1109/ESSCIR.2005.1541617
