An on-chip multi-channel waveform monitor for mixed-signal VLSI diagnostics

Author

Noguchi, Koichiro ; Nagata, Makoto

Author_Institution

Dept. of Comput. & Syst. Eng., Kobe Univ., Japan

fYear

2005

fDate

12-16 Sept. 2005

Firstpage

295

Lastpage

298

Abstract

On-chip multi-channel waveform monitoring technique enhances built-in test and diagnostic capability of mixed-signal VLSI circuits. An 8-channel prototype system incorporates adaptive sample time generation with a 10-bit variable step delay generator and digitization with a 10-bit incremental reference voltage generator. The prototype in a 0.18-μm CMOS technology demonstrated on-chip waveform acquisition at 40-ps and 200-μV resolutions. The waveforms were as accurate as those acquired by an off-chip measurement technique, while 95% reduction of measurement time was achieved.

Keywords

CMOS integrated circuits; VLSI; built-in self test; integrated circuit testing; mixed analogue-digital integrated circuits; waveform generators; 0.18 micron; 10 bit; 200 muV; 40 ps; CMOS technology; adaptive sample time generation; built-in test; mixed-signal VLSI circuits; mixed-signal VLSI diagnostics; multichannel waveform monitor; off-chip measurement technique; on-chip waveform acquisition; on-chip waveform monitor; reference voltage generator; variable step delay generator; Adaptive systems; Built-in self-test; CMOS technology; Circuits; Delay effects; Measurement techniques; Monitoring; Prototypes; Very large scale integration; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Solid-State Circuits Conference, 2005. ESSCIRC 2005. Proceedings of the 31st European

Print_ISBN

0-7803-9205-1

Type

conf

DOI

10.1109/ESSCIR.2005.1541618

Filename

1541618