• DocumentCode
    2546689
  • Title

    Local masking in natural images measured via a new tree-structured forced-choice technique

  • Author

    Vilankar, Kedarnath P. ; Chandler, Damon M.

  • Author_Institution
    Lab. of Comput. Perception & Image Quality (CPIQ), Oklahoma State Univ., Stillwater, OK, USA
  • fYear
    2011
  • fDate
    16-17 June 2011
  • Firstpage
    18
  • Lastpage
    23
  • Abstract
    It is widely known that natural images can hide or mask visual signals, and that this masking ability can vary across different regions of the image. Previous studies have quantified masking by measuring image-wide detection thresholds or local thresholds for select image regions; however, little effort has focused on measuring local thresholds across entire images so as to achieve ground-truth masking maps. Such maps could prove invaluable for testing and refining masking models; however, obtaining these maps requires a prohibitive number of trials using a traditional forced-choice procedure. Here, we present a tree-structured forced-choice procedure (TS-3AFC) designed to efficiently measure local thresholds across images. TS-3AFC requires fewer trials than normal forced-choice by employing recursive patch subdivision in which the child patches are not tested individually until the target is detectable in the parent patch. We show that TS-3AFC can yield masking maps which demonstrate both intrasubject and inter-subject repeatability, and we analyze the performance of a modern masking model and two quality estimators in predicting the obtained ground-truth maps for a small set of images.
  • Keywords
    image watermarking; tree data structures; trees (mathematics); visual perception; TS-3AFC; ground-truth maps; local masking; natural images; tree-structured forced-choice technique; Computational modeling; Correlation; Distortion measurement; Force measurement; Prediction algorithms; Predictive models; Visualization; Masking; forced-choice procedure; image quality; visual detection;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    IVMSP Workshop, 2011 IEEE 10th
  • Conference_Location
    Ithaca, NY
  • Print_ISBN
    978-1-4577-1284-5
  • Type

    conf

  • DOI
    10.1109/IVMSPW.2011.5970348
  • Filename
    5970348