DocumentCode
254686
Title
Color Analysis of Facial Skin: Detection of Emotional State
Author
Ramirez, Geovany A. ; Fuentes, Olac ; Crites, Stephen L. ; Jimenez, M. ; Ordonez, Juan
Author_Institution
Comput. Sci. Dept., Univ. of Texas at El Paso, El Paso, TX, USA
fYear
2014
fDate
23-28 June 2014
Firstpage
474
Lastpage
479
Abstract
Humans show emotion through different channels such as facial expression, head poses, gaze patterns, bodily gestures, and speech prosody, but also through physiological signals such as skin color changes. The concentration levels of hemoglobin and blood oxygenation under the skin vary due to changes in a person´s emotional and physical state, this produces subtle changes in the hue and saturation components of their skin color. In this paper, we present an evaluation of facial skin color changes as the only feature to infer the emotional state of a person. We created a dataset of spontaneous human emotions with a wide range of human subjects of different ages and ethnicities. We used three different types of video clips as stimuli: negative, neutral, and positive to elicit emotions on subjects. We performed experiments using various machine learning algorithms including decision trees, multinomial logistic regression and latent-dynamic conditional random field. Our preliminary results show that facial skin color changes can be used to infer the emotional state of a person in the valence dimension with an accuracy of 77.08%.
Keywords
decision trees; emotion recognition; image colour analysis; learning (artificial intelligence); regression analysis; decision trees; emotional state detection; facial skin color analysis; human emotions; latent-dynamic conditional random field; machine learning algorithms; multinomial logistic regression; negative video clips; neutral video clips; positive video clips; Accuracy; Cameras; Color; Forehead; Image color analysis; Skin; Tensile stress;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Vision and Pattern Recognition Workshops (CVPRW), 2014 IEEE Conference on
Conference_Location
Columbus, OH
Type
conf
DOI
10.1109/CVPRW.2014.76
Filename
6910024
Link To Document