Title :
A versatile low-noise wide-range charge-sensitive preamplifier for HPGe detectors
Author :
Pullia, A. ; Pascovici, Gheorghe ; Ur, C.
Author_Institution :
Dept. of Phys., Univ. of Milano, Milan, Italy
fDate :
Oct. 27 2012-Nov. 3 2012
Abstract :
A fast low-noise hybrid charge-sensitive preamplifier for HPGe detectors, has been designed for the new array detector "GALILEO" under construction at INFN Legnaro National Laboratory (Italy). The preamplifier includes an over-threshold fast-reset circuitry that greatly reduces the dead time due to preamplifier and/or ADC saturation. A I -bit digital output signal is provided in LVDS or CMOS format, whose width yields an indirect precise measurement of the large over-threshold signals. Combining the under- and over-threshold working modes an unprecedented spectroscopic dynamic range is obtained of 105, from 0.1 fC to 10 pC, i.e. from ~2 keY to ISO MeV of equivalent energy in germanium. A fast analogue signal is optionally provided as a trigger for ancillary detectors. The preamplifier is optimized to feature low noise, fast rise time and wide amplitude range when connected to anode detector electrodes. It includes a fast differential buffer for low-noise signal transmission to a remote ADC, with a preset common-mode DC component, that can be adjusted to match the ADC requirement. The rise time, as measured at the test bench, is as fast as 7.5 ns, with a detector capacitance of 23 pF and with a 5m son twisted-pair cable connecting the preamplifier to the ADC. With its input transistor working at 150K the preamplifier features an intrinsic noise of ~90 electrons r.m.s., i.e. ~600eV fwhm in germanium, and a noise slope of 8eV/pF.
Keywords :
nuclear electronics; preamplifiers; semiconductor counters; ADC saturation; GALILEO detector; HPGe detector; ancillary detectors; anode detector electrode; dead time; detector capacitance; low noise charge sensitive preamplifier; over threshold signal; wide range charge sensitive preamplifier;
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2012 IEEE
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-4673-2028-3
DOI :
10.1109/NSSMIC.2012.6551217