• DocumentCode
    2547235
  • Title

    Time-to-digital converters for PET: An examination of metrology aspects

  • Author

    Fishburn, Matthew W. ; Charbon, E.

  • Author_Institution
    Delft Univ. of Technol., Delft, Netherlands
  • fYear
    2012
  • fDate
    Oct. 27 2012-Nov. 3 2012
  • Firstpage
    839
  • Lastpage
    840
  • Abstract
    Time-to-digital converters (TDCs) occur in many realms of high-energy physics, such as time-of-flight positron emission tomography (TOF PET)[1]. Density tests[2] are often used to characterize the non-uniformity of TDCs. Such tests require a uniform time interval generator, often realized by a probabilistic exponential source, such as a single-photon avalanche diode (SPAD), and a known time reference. However, if the exponential source´s event rate is too large, static distortions will occur in the measured INL. Additionally, the correlated shot noise created by the probabilistic source will introduce some uncertainty into measurements of the differential nonlinearity (DNL) and integral non-linearity (INL). This paper will discuss these two unwanted effects, and present measurements showing that the analysis is correct.
  • Keywords
    avalanche diodes; nuclear electronics; positron emission tomography; time-digital conversion; density test; differential nonlinearity; high energy physics; integral nonlinearity; metrology aspect; positron emission tomography; single photon avalanche diode; time-of-flight PET; time-to-digital converter;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2012 IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    1082-3654
  • Print_ISBN
    978-1-4673-2028-3
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2012.6551222
  • Filename
    6551222