DocumentCode
2547235
Title
Time-to-digital converters for PET: An examination of metrology aspects
Author
Fishburn, Matthew W. ; Charbon, E.
Author_Institution
Delft Univ. of Technol., Delft, Netherlands
fYear
2012
fDate
Oct. 27 2012-Nov. 3 2012
Firstpage
839
Lastpage
840
Abstract
Time-to-digital converters (TDCs) occur in many realms of high-energy physics, such as time-of-flight positron emission tomography (TOF PET)[1]. Density tests[2] are often used to characterize the non-uniformity of TDCs. Such tests require a uniform time interval generator, often realized by a probabilistic exponential source, such as a single-photon avalanche diode (SPAD), and a known time reference. However, if the exponential source´s event rate is too large, static distortions will occur in the measured INL. Additionally, the correlated shot noise created by the probabilistic source will introduce some uncertainty into measurements of the differential nonlinearity (DNL) and integral non-linearity (INL). This paper will discuss these two unwanted effects, and present measurements showing that the analysis is correct.
Keywords
avalanche diodes; nuclear electronics; positron emission tomography; time-digital conversion; density test; differential nonlinearity; high energy physics; integral nonlinearity; metrology aspect; positron emission tomography; single photon avalanche diode; time-of-flight PET; time-to-digital converter;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2012 IEEE
Conference_Location
Anaheim, CA
ISSN
1082-3654
Print_ISBN
978-1-4673-2028-3
Type
conf
DOI
10.1109/NSSMIC.2012.6551222
Filename
6551222
Link To Document