DocumentCode :
2547304
Title :
Development of a readout electronic for the measurement of ionization in liquid xenon compton telescope containing micro-patterns
Author :
Lemaire, O. ; Chen, Wen-Tsuen ; Cussonneau, J.-P. ; Delagnes, E. ; Donnard, J. ; Duval, S. ; Gevin, Olivier ; Hadi, A. F. Mohamad ; Morteau, E. ; Oger, T. ; Lavina, L. Scotto ; Thers, D.
Author_Institution :
Lab. SUBATECH, Nantes, France
fYear :
2012
fDate :
Oct. 27 2012-Nov. 3 2012
Firstpage :
858
Lastpage :
861
Abstract :
We report on the electronic dedicated to the acquisition of the ionization current signal induced by the interactions of γ-rays inside a Compton telescope with Liquid Xenon. In order to achieve sub-millimeter resolution we successfully adapted an existing ASIC originally designed for semi-conductor detector with low input capacitance and low dark current called IDeF-x-Lxe, and fabricated in a standard 0.35 μm CMOS technology. With a copper pad area of 0.25 in2 of our first prototype, and a Micromegas micromesh located 50 μm above the anode used as Frisch grid, the noise measurement shows an ENC of ~100 erms- thanks to a meticulous setup. Each part of the coupling between the detector and the electronic has been specially tailored to cope with temperature constraints and with noise requirements.
Keywords :
CMOS integrated circuits; application specific integrated circuits; readout electronics; semiconductor counters; time projection chambers; ASIC; CMOS technology; Frisch grid; IDeF-x-Lxe; Liquid Xenon Compton Telescope; Micromegas micromesh; dark current; input capacitance; ionization current signal acquisition; ionization measurement; micropatterns; readout electronic; semiconductor detector; Compton telescope; Liquid Xenon; Micro-patterns; Time Projection Chamber; medical imaging; three gamma imaging;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2012 IEEE
Conference_Location :
Anaheim, CA
ISSN :
1082-3654
Print_ISBN :
978-1-4673-2028-3
Type :
conf
DOI :
10.1109/NSSMIC.2012.6551226
Filename :
6551226
Link To Document :
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