Title :
Dealing with data pitfall in RFID network
Author :
Liew, C.Z. ; Shaw, R.
Author_Institution :
Charles Lab., SmartSys Group Hamilton, Hamilton, ON, Canada
Abstract :
In this brief paper, the issue of pitfall effect in RFID network is studied. We model the system as multi-hop random walk mesh network and discuss this phenomenon connecting with Galton effect. Based on analysis, a strategy for dealing with the pitfall problem is proposed with self-adaptive operation for each node to adjust the probability of dynamical selecting the routine branches for load balance with default equal probability distribution. Experimental results show that the system with proposed approach provides an efficient and more balanced in data distribution pattern.
Keywords :
probability; radiofrequency identification; wireless mesh networks; Galton effect; RFID network; data distribution pattern; data pitfall; load balance; multihop random walk mesh network; probability distribution; routine branch; self-adaptive operation; Actuators; Load modeling; Mesh networks; Radiofrequency identification; Receivers; Spread spectrum communication; Transponders; Galton effect; RFID network; multi-hop random walk;
Conference_Titel :
Consumer Electronics - China, 2014 IEEE International Conference on
Conference_Location :
Shenzhen
DOI :
10.1109/ICCE-China.2014.7029853
