DocumentCode
254795
Title
Improved expected patch Log likelihood scheme for image denoising
Author
Shasha Zhu ; Nian Cai ; Shengru Wang ; Meilin Wang ; Shaowei Weng
Author_Institution
Sch. of Inf. Eng., Guangdong Univ. of Technol., Guangzhou, China
fYear
2014
fDate
9-13 April 2014
Firstpage
1
Lastpage
2
Abstract
To solve the inherent non-adaptive problem existed in the expected patch Log likelihood (EPLL), an updating process of the Gaussian mixture model introduced into the EPLL and an improved EPLL scheme via adaptive Gaussian mixture prior is proposed in this paper. Experimental results show that the proposed method outperforms the existing image denoising algorithms.
Keywords
Gaussian processes; image denoising; mixture models; adaptive Gaussian mixture model; image denoising; improved EPLL scheme; improved expected patch log likelihood scheme; updating process; Educational institutions; Gaussian mixture model; Image denoising; Image restoration; Wiener filters; Gaussian mixture models; Gaussian mixture prior update; Wiener filter; image denoising;
fLanguage
English
Publisher
ieee
Conference_Titel
Consumer Electronics - China, 2014 IEEE International Conference on
Conference_Location
Shenzhen
Type
conf
DOI
10.1109/ICCE-China.2014.7029878
Filename
7029878
Link To Document