Title :
Novel Berger code checker
Author :
Metr, Cecilia ; Favalli, Michele ; Ricco, Bruno
Author_Institution :
Dipartimento di Elettronica, Inf. e Sistemistica, Bologna Univ., Italy
Abstract :
This paper presents a novel checking circuit for Berger codes, with any value of k (also k=2r-1), which is TSC with respect to a wide set of realistic faults including all possible stuck-ats, transistors stuck-on/stuck-open, as well as several likely to occur resistive bridgings. With respect to the other alternative implementations the proposed checker features the advantage of being inherently more testable, and of requiring lower area overhead
Keywords :
error detection codes; failure analysis; fault diagnosis; Berger codes; TSC; area overhead; checking circuit; resistive bridgings; stuck-ats; stuck-on faults; stuck-open faults; totally self-checking; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Conferences; Encoding; Error correction codes; Joining processes; Synthetic aperture sonar; System testing;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 1995. Proceedings., 1995 IEEE International Workshop on,
Conference_Location :
Lafayette, LA
Print_ISBN :
0-8186-7107-6
DOI :
10.1109/DFTVS.1995.476963
