DocumentCode :
2548470
Title :
A Wideband EMP Test System
Author :
Rohwein, G.J. ; Aurand, J.F. ; Frost, CA ; Roose, L.D. ; Babcock, S.R.
Author_Institution :
Sandia National Laboratories
fYear :
1994
fDate :
27-30 Jun 1994
Firstpage :
67
Lastpage :
70
Keywords :
Circuit testing; EMP radiation effects; Pulse shaping methods; Shape control; Sparks; Switches; System testing; Transmission lines; Voltage; Wideband;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Modulator Symposium, 1994., Twenty-First International
ISSN :
1076-8467
Type :
conf
DOI :
10.1109/MODSYM.1994.597044
Filename :
597044
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2548470
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