DocumentCode :
2549201
Title :
Application of the measured equation of invariance to transmission lines and discontinuities
Author :
Prouty, M.D. ; Pous, R. ; Mei, K.M. ; Schwarz, S.E.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA
fYear :
1993
fDate :
June 28 1993-July 2 1993
Firstpage :
280
Abstract :
The MEI (measured equation of invariance) method can easily be applied to static analyses of uniform transmission lines, such as single and coupled microstrip lines. Laplace´s equation is solved for the static electric potential, and the total charges on the metal structures are found. Solving the problem with the correct permittivity values for the dielectrics yields the capacitance of the structures, while solving the problem with all permittivities equal to the free-space value yields the inductances. The quasi-static impedance values may then be obtained. Planar microstrip-type structures, where currents are confined to two dimensions are also considered. Results are presented for cases where no dielectric is present. This simplifies the Green´s function calculation for the present purposes, but the method may be applied to more general cases.<>
Keywords :
Green´s function methods; Laplace equations; capacitance; electric potential; finite element analysis; inductance; invariance; microstrip discontinuities; permittivity; planar waveguides; transmission line theory; Green´s function calculation; Laplace´s equation; capacitance; charges; coupled microstrip lines; discontinuities; inductances; measured equation of invariance; permittivities; quasi-static impedance; static electric potential; uniform transmission lines; Capacitance; Couplings; Dielectrics; Electric potential; Green´s function methods; Impedance; Laplace equations; Microstrip; Permittivity measurement; Transmission line measurements;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Antennas and Propagation Society International Symposium, 1993. AP-S. Digest
Conference_Location :
Ann Arbor, MI, USA
Print_ISBN :
0-7803-1246-5
Type :
conf
DOI :
10.1109/APS.1993.385350
Filename :
385350
Link To Document :
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