Title :
Virtualizing Modern High-Speed Interconnection Networks with Performance and Scalability
Author :
Li, Bo ; Huo, Zhigang ; Zhang, Panyong ; Meng, Dan
Author_Institution :
Nat. Res. Center for Intell. Comput. Syst., Chinese Acad. of Sci., Beijing, China
Abstract :
As one of the most important enabling technologies of cloud computing, virtualization brings to HPC good manageability, online system maintenance, performance isolation and fault isolation. Furthermore, previous study on VMM-bypass I/O that virtualizes OS-bypass networks (e.g. InfiniBand) relieved the worry of performance degradation coming along with virtualization. In this paper, we address the scalability challenges imposed upon OS-bypass networks under virtualized environments. The eXtended Reliable Connection (XRC) transport, proposed in modern high-speed interconnection networks to address the scalability problem in large scale applications, would not work in virtualized environments. To solve the problem, we propose VM-proof XRC design to eliminate the scalability gap between virtualized and native environments. Prototype evaluation shows that the virtualization of modern high-speed interconnection networks could get the same raw performance and scalability as in native non-virtualized environment with our VM-proof XRC design. The connection memory scalability shows a potential of 16 times improvement on virtualized clusters composed of 16-core nodes.
Keywords :
Internet; fault tolerant computing; virtual machines; HPC; OS-bypass network virtualization; VM-proof XRC design; VMM-bypass I/O; cloud computing; extended reliable connection; fault isolation; high-speed interconnection networks; online system maintenance; performance isolation; Clouds; Driver circuits; Multiprocessor interconnection; Performance evaluation; Prototypes; Radiation detectors; Scalability; InfiniBand; OS-bypass; Xen; cloud; virtualization;
Conference_Titel :
Cluster Computing (CLUSTER), 2010 IEEE International Conference on
Conference_Location :
Heraklion, Crete
Print_ISBN :
978-1-4244-8373-0
Electronic_ISBN :
978-0-7695-4220-1
DOI :
10.1109/CLUSTER.2010.19