DocumentCode
2549266
Title
Design of strain gauge structure
Author
Husak, M. ; Kulha, P. ; Jakovenko, J. ; Výborný, Z.
Author_Institution
Dept. of Microelectron., Czech Tech. Univ., Prague, Czech Republic
fYear
2002
fDate
14-16 Oct. 2002
Firstpage
75
Lastpage
78
Abstract
The paper describes the design of a strain gauge on a cantilever with implanted layers. In the paper, the physical model of implanted strain gauges is characterized and basic technological steps are described. Simulation using CoventorWare (MEMCAD) program is used to verify the mechanical properties and temperature distribution in cantilever structures. A suitable electric bridge connection of the structure for evaluation of electric parameters of strain gauges at mechanic deformation and different temperatures has been designed. On realized structures, basic parameters have been measured such as the dependence of electric parameters of strain gauges on mechanical deformation, temperature dependence at different mechanical load, temperature stability of output parameters, and temperature dependence of pn junctions in the structure. From the measured data, piezoresistive coefficients of deformation sensitivity, linearity, hysteresis, temperature coefficients of resistance, etc. have been calculated. The measured characteristics show very good linearity, small hysteresis and very good sensitivity.
Keywords
CAD; deformation; digital simulation; strain gauges; thermal stability; CoventorWare MEMCAD program simulation; electric bridge connection; electric parameters; implanted layer cantilever; mechanical deformation; mechanical load; mechanical properties; physical model; piezoresistive coefficients; pn junctions; sensitivity; strain gauge structure design; temperature dependence; temperature distribution; temperature stability; Capacitive sensors; Electrical resistance measurement; Hysteresis; Linearity; Mechanical factors; Paper technology; Strain measurement; Temperature dependence; Temperature distribution; Temperature sensors;
fLanguage
English
Publisher
ieee
Conference_Titel
Advanced Semiconductor Devices and Microsystems, 2002. The Fourth International Conference on
Print_ISBN
0-7803-7276-X
Type
conf
DOI
10.1109/ASDAM.2002.1088479
Filename
1088479
Link To Document