DocumentCode :
2549286
Title :
Beam profile monitoring system for proton therapy and Monte Carlo modeling of proton beam lateral development in water in 100–400MeV
Author :
Lin, C.H. ; Cai, S.Y. ; Chang, F.X. ; Chu, M.L. ; Teng, P.K. ; Chen, A.E. ; Tsai, P.R. ; Tsai, Y.W. ; Wang, C.H. ; Hsieh, C.W. ; Duh, T.S. ; Lee, J.H. ; Chao, T.C. ; Dai, S.J. ; Lee, C.C. ; Tung, C.J.
Author_Institution :
Inst. of Phys., Acad. Sinica, Taipei, Taiwan
fYear :
2012
fDate :
Oct. 27 2012-Nov. 3 2012
Firstpage :
1268
Lastpage :
1271
Abstract :
Parallel plate ionization chambers with segmented strips or pixels are developed for proton beam monitoring and dose measurement. 256 channels of readout electronics together with high voltage power supplier, FPGA and USB are built on a single PCB and readout by LABVIEW based DAQ system. With replaceable resistors, sensitivity of each channel varies from 1 ADC / 1 nA to 1 ADC / 5 pA to handle large dynamical range in proton therapy. Chambers are tested with 100,200 and 394 MeV proton beams with narrow beam widths. Beam profiles obtained by strip and by pad chambers are compared. Depth dose distributions of protons in water are obtained with 100 and 200 MeV proton beams. Results from the GEANT4 simulation reproduce measurement reasonably.
Keywords :
Monte Carlo methods; analogue-digital conversion; data acquisition; field programmable gate arrays; ionisation chambers; nuclear electronics; particle beam diagnostics; printed circuits; proton beams; radiation therapy; readout electronics; resistors; ADC; FPGA; GEANT4 simulation; LABVIEW based DAQ system; Monte Carlo modeling; PCB; USB; beam profile monitoring system; dose measurement; electron volt energy 100 MeV to 400 MeV; high voltage power supplier; narrow beam widths; pad chambers; parallel plate ionization chambers; proton beam lateral development; proton beam monitoring; proton therapy; readout electronics; resistors; strip chambers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2012 IEEE
Conference_Location :
Anaheim, CA
ISSN :
1082-3654
Print_ISBN :
978-1-4673-2028-3
Type :
conf
DOI :
10.1109/NSSMIC.2012.6551310
Filename :
6551310
Link To Document :
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