DocumentCode
2549952
Title
Factors affecting the transition from a water tree to an electrical tree
Author
Bulinski, A.T. ; Bamji, S.S. ; Densley, R.J.
Author_Institution
Nat. Res. Council of Canada, Ottawa, Ont., Canada
fYear
1988
fDate
5-8 June 1988
Firstpage
327
Lastpage
330
Abstract
Electric stress, voltage waveshape, temperature, contaminants and insulation resistance to oxidation have been analyzed as to their influence on triggering breakdown of a water-treed polymer. The transition from a water tree to an electrical tree is dependent on several factors, including voltage waveshape, and magnitude, temperature, the insulation/semiconducting shield interface, and possibly the oxidative state of the insulation. For field-aged cables and molded specimens, the electrical tree always initiated when the water tree had reached or was within approximately 200 mu m of the adjacent surface. Shorter duration overvoltages required higher voltages to cause breakdown. There was some overlap in the breakdown voltages caused by 250/2500 mu s impulses and 60 Hz. High temperature decreased the time required to initiate an electrical tree, possibly due to the increased oxidation that occurs at the higher temperature. No particular contaminant or contaminant concentration was found to correlate directly with the event of the transition from a water tree to an electrical tree.<>
Keywords
ageing; electric breakdown of solids; insulation testing; organic insulating materials; oxidation; polymers; 60 Hz; breakdown voltages; contaminants; electrical tree; field-aged cables; insulation testing; insulation/semiconducting shield interface; molded specimens; overvoltages; oxidation resistance; polymer; temperature dependence; voltage waveshape; water tree; Breakdown voltage; Dielectrics and electrical insulation; Electric resistance; Oxidation; Plastic insulation; Polymers; Semiconductivity; Stress; Temperature dependence; Trees - insulation;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Insulation, 1988., Conference Record of the 1988 IEEE International Symposium on
Conference_Location
Cambridge, MA, USA
ISSN
1089-084X
Type
conf
DOI
10.1109/ELINSL.1988.13933
Filename
13933
Link To Document