DocumentCode :
2550311
Title :
TE characterization of resistive strip gratings on a dielectric slab using a single edge-mode expansion
Author :
Volakis, J.L. ; Lin, Y.C. ; Anastasiou, H.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
fYear :
1993
fDate :
June 28 1993-July 2 1993
Firstpage :
90
Abstract :
The authors present an efficient analysis and characterization of narrow resistive strip arrays residing on a dielectric substrate. Simple closed-form formulas for mode reflection and transmission coefficients of the resistive grating on a substrate are presented. This is accomplished by employing a single physical basis or edge mode to represent the strip current. The periodic Green´s function is derived using the procedure employed by K. Sarabandi (1990), and the resulting series has a relatively fast convergence. A careful study is done to establish the accuracy bounds of the physical basis expansion and the resulting mode coefficients. From the derived closed-form formulas, equivalent sheet boundary conditions and equivalent circuit parameters are given for a complete characterization of the grating.<>
Keywords :
Green´s function methods; convergence of numerical methods; electromagnetic wave reflection; electromagnetic wave transmission; equivalent circuits; TE characterization; accuracy; convergence; dielectric slab; equivalent circuit parameters; equivalent sheet boundary conditions; mode reflection; periodic Green´s function; physical basis expansion; resistive strip gratings; single edge-mode expansion; strip current; transmission coefficients; Boundary conditions; Conductivity; Dielectric substrates; Gratings; Impedance; Reflection; Reflectivity; Slabs; Strips; Tellurium;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Antennas and Propagation Society International Symposium, 1993. AP-S. Digest
Conference_Location :
Ann Arbor, MI, USA
Print_ISBN :
0-7803-1246-5
Type :
conf
DOI :
10.1109/APS.1993.385395
Filename :
385395
Link To Document :
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