• DocumentCode
    2550397
  • Title

    Effects of numerical dispersion on the accuracy of FDTD modeling of propagating and evanescent waves in negative index media

  • Author

    Sarris, Costas D.

  • Author_Institution
    Edward S. Rogers Sr. Dept. of Electr. & Comput. Eng., Univ. of Toronto, Toronto, ON, Canada
  • fYear
    2009
  • fDate
    7-12 June 2009
  • Firstpage
    249
  • Lastpage
    252
  • Abstract
    Discrete space-time methods, primarily FDTD, have played a major role in illuminating the underlying physics of unconventional phenomena (negative refraction, growing evanescent waves and super-lensing) in negative index media. Yet, a survey of the relevant FDTD literature indicates a number of contradictory results, which stem from inherent limitations of the method. This paper is focused on the impact of numerical dispersion on the FDTD study of the ldquoperfect lensrdquo. It is shown that the calculated resolution of such a lens is primarily related to the FDTD cell size rather than the medium itself, due to the sensitivity of the numerical attenuation constant of evanescent waves. While the introduction of material losses improves the convergence of such simulations, it deteriorates their accuracy. Specific conditions are stated for achieving certain accuracy levels with standard FDTD and high-order finite differences.
  • Keywords
    dispersion (wave); electromagnetic wave propagation; finite difference time-domain analysis; FDTD modeling; discrete space-time method; evanescent wave propagation; finite difference time domain analysis; negative index media; numerical attenuation constant; numerical dispersion; perfect lens study; Convergence; Dispersion; Finite difference methods; Lenses; Magnetic analysis; Optical materials; Physics; Slabs; Strontium; Time domain analysis; Finite-diffference Time-Domain; negative index media; numerical dispersion;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 2009. MTT '09. IEEE MTT-S International
  • Conference_Location
    Boston, MA
  • ISSN
    0149-645X
  • Print_ISBN
    978-1-4244-2803-8
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2009.5165680
  • Filename
    5165680