• DocumentCode
    2550508
  • Title

    Testing radiation tolerance of optical transceivers for the SuperB experiment

  • Author

    Aloisio, Alberto ; Ameli, F. ; Bocci, V. ; Chiodi, G. ; Giordano, Raffaele

  • Author_Institution
    INFN, Univ. degli Studi di Napoli "Federico II", Naples, Italy
  • fYear
    2012
  • fDate
    Oct. 27 2012-Nov. 3 2012
  • Firstpage
    1521
  • Lastpage
    1522
  • Abstract
    SuperB is a novel, high-luminosity (1036 cm-2s-1), asymmetric e+e- collider to be built at the future Cabibbo Laboratory, in the campus of the University of Rome Tor Vergata (Italy). A detector aimed at studying the B physics will be installed in this facility. High-speed serial links will be used for trigger, control and data read-out. The on-detector ends of the links will have to withstand a hadron fluence of 8 · 1010 cm-2 per effective year (107 s). In this work, we present results of irradiation tests on off-the-shelf optical transceivers, candidate for deployment in SuperB. We irradiated the components with a 62-MeV proton beam at INFN Laboratori Nazionali del Sud (Catania, Italy). By means of our setup, we recorded parameters such as BER, drawn current and optical power, for the laser and for the photodiode, as a function of the absorbed dose. We discuss our results in the view of the deployment of the considered components in the SuperB experimental apparatus.
  • Keywords
    dosimetry; nuclear electronics; optical transceivers; photodiodes; proton effects; readout electronics; B physics; Cabibbo Laboratory; INFN Laboratori Nazionali del Sud; SuperB experiment; University of Rome Tor Vergata; absorbed dose function; control read-out; data read-out; hadron fluence; high-luminosity asymmetric electron+positron collider; high-speed serial links; optical transceivers; photodiode; proton beam irradiation tests; radiation tolerance testing; trigger system; FPGA; Serial Links; rad-tolerance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2012 IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    1082-3654
  • Print_ISBN
    978-1-4673-2028-3
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2012.6551365
  • Filename
    6551365