• DocumentCode
    2550509
  • Title

    Calculation of characteristic impedance for parallel coupled stripline based on eigenmode analysis and equivalent network

  • Author

    Hiraoka, Takaharu ; Ding, Kai ; Hsu, Jui-Pang

  • Author_Institution
    Fac. of Eng., Kanagawa Univ., Yokohama, Japan
  • fYear
    2009
  • fDate
    7-12 June 2009
  • Firstpage
    269
  • Lastpage
    272
  • Abstract
    Exact calculation of characteristic impedance for a single and a parallel coupled stripline or microstrip line is needed to analysis and synthesis of stripline circuits. There are many calculation methods for the stripline with zero thickness or finite thickness of strip conductor. Analytical solution for zero thickness has already been given by conformal mapping method, but that for finite thickness have not been given and approximated solution has been given by fringing capacitance method. Here, we propose a new and systematic mode analysis method, which is based on eigenmode expansion and lateral equivalent network. Exact characteristic impedance for narrow-side coupled parallel stripline with any strip thickness including zero thickness can be obtained by a line integral of electric field and a contour integral of magnetic field.
  • Keywords
    eigenvalues and eigenfunctions; electric fields; magnetic fields; microstrip lines; network synthesis; strip line circuits; characteristic impedance calculation; conformal mapping method; contour integral field; eigenmode analysis; electric field; fringing capacitance method; lateral equivalent network; magnetic field; microstrip line; narrow-side coupled parallel stripline; stripline circuits; Capacitance; Circuit synthesis; Conductors; Conformal mapping; Coupling circuits; Impedance; Microstrip; Network synthesis; Stripline; Strips; Characteristic impedance; Eigenmode; Equivalent network; Parallel coupled stripline;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 2009. MTT '09. IEEE MTT-S International
  • Conference_Location
    Boston, MA
  • ISSN
    0149-645X
  • Print_ISBN
    978-1-4244-2803-8
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2009.5165685
  • Filename
    5165685