Title :
Elimination of PCB test damages by strict parameter control
Author :
Hroundas, George
Author_Institution :
Trace Instrum., Canoga Park, CA, USA
Abstract :
The effects of various voltage and current stimulus levels on fine-line bare boards, hybrids, and substrates are examined. The need for strict control of these parameters in order not to degrade or destroy the foundation upon which most complex and expensive circuits are built is illustrated. The impact of test stimulus voltage on both conductor integrity and isolation resistance is explored, along with the economic effects that can result from less than optimum testing strategies and parameters
Keywords :
economics; printed circuit testing; PCB test; conductor integrity; current stimulus levels; damage elimination; economic effects; electrical stresses; fine-line bare boards; hybrids; isolation resistance; optimum testing strategies; substrates; voltage stimulus levels; Assembly; Circuit faults; Circuit testing; Contamination; Electrostatic discharge; Printed circuits; Semiconductor device testing; Semiconductor devices; Substrates; Voltage;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1988. IMTC-88. Conference Record., 5th IEEE
Conference_Location :
San Diego, CA
DOI :
10.1109/IMTC.1988.10887