Title :
Statistical features-ANN recognizer for bivariate process mean shift pattern recognition
Author :
Masood, Ibrahim ; Hassan, Adnan
Author_Institution :
Fac. of Mech. & Manuf. Eng., Univ. Tun Hussein Onn Malaysia, Parit Raja, Malaysia
Abstract :
Artificial neural network (ANN)-based recognizers have been developed for monitoring and diagnosis bivariate process mean shift in multivariate statistical process control (MSPC). They have better average run lengths (ARLs) performance in monitoring process mean shifts and gave an useful diagnosis information compared to the traditional MSPC schemes such as T2, multivariate cumulative sum (MCUSUM) and multivariate exponentially weighted moving average (MEWMA). The existing recognizers are raw data-based, whereby raw data input representation were applied into ANN. This approach required in a large network size, more computational effort and training time consuming. In this paper, the statistical features input representation was investigated, whereby the raw data were transformed into exponentially weighted moving average, multiplication of mean with standard deviation and multiplication of mean with mean-square value. The statistical features-ANN recognizer resulted in smaller network size, fast training time, better ARLs for monitoring process mean shifts and comparable recognition accuracy for diagnosing the source variable(s) compared to the raw data-ANN recognizer.
Keywords :
moving average processes; neurocontrollers; quality control; statistical process control; ANN recognizer; MSPC; artificial neural network; bivariate process mean shift pattern recognition; exponentially weighted moving average; mean-square value; multivariate statistical process control; statistical feature; Artificial neural networks; Correlation; Monitoring; Neurons; Pattern recognition; Process control; Training; Artificial neural network; bivariate process; multivariate quality control; statistical features; statistical features input representation;
Conference_Titel :
Intelligent and Advanced Systems (ICIAS), 2010 International Conference on
Conference_Location :
Kuala Lumpur, Malaysia
Print_ISBN :
978-1-4244-6623-8
DOI :
10.1109/ICIAS.2010.5716155