Title :
Characterization of nonlinear behavior in a tunable phase shifter using ferroelectric PZT thin-film capacitors and its effect on system performance
Author :
Qiu, J.X. ; Judy, D.C. ; Pulskamp, J.S. ; Polcawich, R.G. ; Kaul, R. ; Crowne, F.
Author_Institution :
Army Res. Lab., Adelphi, MD, USA
Abstract :
In this paper, the nonlinear behavior in a tunable phase shifter using ferroelectric lead zirconate titanate (PZT) thin-film capacitors is described. The phase shifter is of reflection-type consisting of a coplanar waveguide Lange coupler and two ferroelectric PZT varactors on high resistivity silicon substrate. The nonlinearity is characterized by measuring the AM/AM and AM/PM transfer curves of the device, a technique that is commonly used to characterize power amplifiers. The responses of the device to two-tone and quadrature-amplitude-modulation waveforms are then estimated according to the measured transfer curves.
Keywords :
circuit tuning; coplanar waveguide components; ferroelectric capacitors; lead compounds; phase shifters; thin film capacitors; waveguide couplers; AM-AM transfer curve measurement; AM-PM transfer curve measurement; PZT; Si; coplanar waveguide Lange coupler; ferroelectric thin-film capacitor; high resistivity silicon substrate; nonlinear behavior; quadrature-amplitude-modulation waveforms; tunable phase shifter; varactors; Capacitors; Conductivity; Coplanar waveguides; Ferroelectric materials; Phase shifters; Silicon; System performance; Titanium compounds; Transistors; Varactors; EVM; Ferroelectric thin-film; PZT; QAM; intermodulation; nonlinear distortion; tunable phase shifter;
Conference_Titel :
Microwave Symposium Digest, 2009. MTT '09. IEEE MTT-S International
Conference_Location :
Boston, MA
Print_ISBN :
978-1-4244-2803-8
Electronic_ISBN :
0149-645X
DOI :
10.1109/MWSYM.2009.5165703
