• DocumentCode
    2551001
  • Title

    Backscatter measurements of soil surfaces at millimeter wave frequencies

  • Author

    Nashashibi, A. ; Sarabandi, K. ; Ciccarelli, S. ; Ulaby, F.T. ; Siqueira, P.

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
  • fYear
    1993
  • fDate
    June 28 1993-July 2 1993
  • Firstpage
    1300
  • Abstract
    The measured backscattering coefficients of three sandy soil surfaces are presented. The measurements were conducted using 35 and 94 GHz polarimetric scatterometers. The measured backscattering coefficients are compared to those predicted by the classical surface scattering models (physical optics and geometric optics). Furthermore, the results are compared to a recently developed empirical model based on observations made at microwave frequencies. Preliminary analysis shows that none of the above models is capable of predicting the measured backscattering coefficients accurately and that volume scattering from the voids inside the soil layer, computed via the radiative transfer theory, must be considered. It is shown that a combination of surface and volume scattering terms will adequately characterize the backscattering from soil surface at millimeter wave frequencies.<>
  • Keywords
    backscatter; electromagnetic wave scattering; geophysical techniques; millimetre wave measurement; polarimetry; radiative transfer; radiometry; sand; soil; 35 GHz; 94 GHz; backscattering coefficients; empirical model; millimeter wave frequencies; polarimetric scatterometers; radiative transfer theory; sandy soil surfaces; surface scattering models; volume scattering; Backscatter; Millimeter wave measurements; Optical scattering; Optical surface waves; Physical optics; Predictive models; Radar measurements; Soil measurements; Solid modeling; Surface waves;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium, 1993. AP-S. Digest
  • Conference_Location
    Ann Arbor, MI, USA
  • Print_ISBN
    0-7803-1246-5
  • Type

    conf

  • DOI
    10.1109/APS.1993.385432
  • Filename
    385432