Direct MOSFET parameters extraction using Fourier-space techniques

Author

Picos, R. ; Roca, M. ; Iñiguez, B. ; Bellodi, M. ; Flandre, D. ; García-Moreno, E.

Author_Institution

Grup de Tecnologia Electronica, Univ. de les Illes Balears, Spain

Volume

1

fYear

2004

fDate

3-5 Nov. 2004

Firstpage

9

Lastpage

13

Abstract

A new MOSFET parameter extraction tool is presented. This tool uses digital signal processing techniques to increase the signal/noise ratio within well-known extraction methods based on determining maxima of derivatives. This signal processing is related with calculations based on Fourier transform and filtering procedures to smooth data. The procedure is applied to extract three different parameters, and results are compared with other methods using experimental data.

Keywords

Fourier transforms; MOSFET; smoothing methods; Fourier transform; Fourier-space techniques; MOSFET parameter extraction tool; digital signal processing; filtering procedures; saturation voltage extraction; smoothing methods; threshold voltage extraction; Data mining; Digital signal processing; Fourier transforms; MOSFET circuits; Noise measurement; Noise shaping; Parameter extraction; Shape measurement; Signal processing; Threshold voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Devices, Circuits and Systems, 2004. Proceedings of the Fifth IEEE International Caracas Conference on

Print_ISBN

0-7803-8777-5

Type

conf

DOI

10.1109/ICCDCS.2004.1393344

Filename

1393344