DocumentCode
2551901
Title
A new test compression scheme
Author
Bhaumik, Basabi ; Visweswaran, G.S. ; Lakshminarasimhan, R.
Author_Institution
Dept. of Electr. Eng., Indian Inst. of Technol., New Delhi, India
fYear
1999
fDate
7-10 Jan 1999
Firstpage
95
Lastpage
98
Abstract
Generalized Modified Positional Syndrome (GMPS), of order p, a new compaction scheme for test output data is presented. The order p determines the aliasing probability and the amount of hardware overhead required to implement the scheme. GMPS of order two gives an aliasing probability about an order of magnitude lower than the best scheme reported in literature with minimal extra hardware. A hardware realization scheme for GMPS has been presented. The scheme uses adders with feedback
Keywords
adders; circuit feedback; data compression; integrated circuit testing; Generalized Modified Positional Syndrome; adder; aliasing probability; data compaction; feedback; hardware overhead; test compression; Airports; Circuit testing; Compaction; Data compression; Hardware; Integrated circuit testing; Satellites; Semiconductor device measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Design, 1999. Proceedings. Twelfth International Conference On
Conference_Location
Goa
ISSN
1063-9667
Print_ISBN
0-7695-0013-7
Type
conf
DOI
10.1109/ICVD.1999.745131
Filename
745131
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