DocumentCode :
2551903
Title :
Comparison between nonlinear characteristics of n-channel and p-channel FD SOI MOSFETs
Author :
Conde, Jorge E. ; Cerdeira, Antonio ; Flandre, Denis
Author_Institution :
SEES, CINVESTAV, Mexico, Mexico
Volume :
1
fYear :
2004
fDate :
3-5 Nov. 2004
Firstpage :
122
Lastpage :
125
Abstract :
The nonlinear characteristics of NMOSFET and PMOSFET are of prime importance in the performance analysis of analog applications of transistors and circuits fabricated with CMOS technology, because these transistors have different physical principles of operation. NMOSFET channel is in inversion, while the PMOSFET channel is in accumulation. In this paper we present a comparison between nonlinear characteristics of fully depleted (FD) SOI NMOSFET and SOI PMOSFET, as function of transistor parameters and operation regime. Advantages of one type over the other depend of the operation regime and the channel length.
Keywords :
MOSFET; harmonic distortion; silicon-on-insulator; CMOS technology; NMOSFET; PMOSFET; analog application; fully depleted SOI MOSFET; harmonic distortion; integral function method; nonlinear characteristics; CMOS analog integrated circuits; CMOS technology; Current-voltage characteristics; Harmonic analysis; Harmonic distortion; MOSFET circuits; Performance analysis; Threshold voltage; Total harmonic distortion; Voltage measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Devices, Circuits and Systems, 2004. Proceedings of the Fifth IEEE International Caracas Conference on
Print_ISBN :
0-7803-8777-5
Type :
conf
DOI :
10.1109/ICCDCS.2004.1393366
Filename :
1393366
Link To Document :
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