Title :
Yield enhancement by means of evolutionary computation techniques
Author :
Zielinski, Lukasz ; Puchalski, Bartlomiej ; Rutkowski, Jerzy
Author_Institution :
Dept. of Autom. Control, Electron. & Comput. Sci., Silesian Univ. of Technol., Gliwice
Abstract :
This paper undertakes the problem of parametric yield enhancement by means of evolutionary computation techniques. This subject is an extremely important element of analogue circuit CAD and only heuristic approaches are applicable, since the problem belongs to NP-hard category. This paper proposes an entirely new approach to the problem, based on evolutionary computation techniques and Monte Carlo simulations. Design guidelines for yield optimization are described. The approach is verified on benchmark examples and significant improvement, when compared with other design methods, can be observed
Keywords :
Monte Carlo methods; circuit complexity; circuit optimisation; evolutionary computation; integrated circuit yield; Monte Carlo simulations; NP-hard problem; analogue circuit CAD; evolutionary computation; heuristic approach; parametric yield enhancement; yield optimization; Biological cells; Circuits; Computer science; Design automation; Design optimization; Evolutionary computation; Guidelines; Linear approximation; Manufacturing; Monte Carlo methods;
Conference_Titel :
Circuits and Systems, 2006. ISCAS 2006. Proceedings. 2006 IEEE International Symposium on
Conference_Location :
Island of Kos
Print_ISBN :
0-7803-9389-9
DOI :
10.1109/ISCAS.2006.1693662
