Yield enhancement by means of evolutionary computation techniques

Author

Zielinski, Lukasz ; Puchalski, Bartlomiej ; Rutkowski, Jerzy

Author_Institution

Dept. of Autom. Control, Electron. & Comput. Sci., Silesian Univ. of Technol., Gliwice

fYear

2006

fDate

21-24 May 2006

Lastpage

4634

Abstract

This paper undertakes the problem of parametric yield enhancement by means of evolutionary computation techniques. This subject is an extremely important element of analogue circuit CAD and only heuristic approaches are applicable, since the problem belongs to NP-hard category. This paper proposes an entirely new approach to the problem, based on evolutionary computation techniques and Monte Carlo simulations. Design guidelines for yield optimization are described. The approach is verified on benchmark examples and significant improvement, when compared with other design methods, can be observed

Keywords

Monte Carlo methods; circuit complexity; circuit optimisation; evolutionary computation; integrated circuit yield; Monte Carlo simulations; NP-hard problem; analogue circuit CAD; evolutionary computation; heuristic approach; parametric yield enhancement; yield optimization; Biological cells; Circuits; Computer science; Design automation; Design optimization; Evolutionary computation; Guidelines; Linear approximation; Manufacturing; Monte Carlo methods;

fLanguage

English

Publisher

ieee

Conference_Titel

Circuits and Systems, 2006. ISCAS 2006. Proceedings. 2006 IEEE International Symposium on

Conference_Location

Island of Kos

Print_ISBN

0-7803-9389-9

Type

conf

DOI

10.1109/ISCAS.2006.1693662

Filename

1693662