Title :
An system analysis of the reliability method based on sample´s weighting — Uniform experimental-stochastic FEM
Author :
Yang, Zhigang ; Li, Huokun ; Li, Lianghui
Author_Institution :
Sch. of Archit. Eng., Nanchang Univ., Nanchang, China
Abstract :
Based on reliability theory of total Probability, with the concept of sample´s weighting coefficient, the minimum sample size can be obtained according to the numerical characteristic values of random variables and the minor sample t-distribution estimation under a certain expected value. And then the design of Uniform Experimental is used to system analysis, which can greatly reduce the number of experiments of stochastic FEM. Meanwhile, the weight coefficients of the random sample combinations are determined using the Bayes formula, and different sample combinations are taken as the input for system analysis. According to one-to-one mapping between the input sample combination and the output coefficient, the reliability index can be obtained with the multiplication principle. According to the weighting coefficient of corresponding random samples, the reliability index is obtained by the use of Bayes formula. At last the reliability method of system analysis based on sample´s weighting -uniform experimental-stochastic FEM is tested to be feasible and effective for large and complex system analysis and practical experience in engineering project.
Keywords :
Bayes methods; probability; reliability theory; stochastic processes; Bayes formula; multiplication principle; numerical characteristic; reliability method; samples weighting; system analysis; t-distribution estimation; uniform experimental stochastic FEM; Computational modeling; Design for experiments; Equations; Finite element methods; Random variables; Reliability engineering; Reliability theory; Sampling methods; Stochastic systems; System testing; Uniform Experiment; reliability method; sample´s weighting; stochastic FEM; system analysis;
Conference_Titel :
Information Management and Engineering (ICIME), 2010 The 2nd IEEE International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-5263-7
Electronic_ISBN :
978-1-4244-5265-1
DOI :
10.1109/ICIME.2010.5477983