DocumentCode
2552063
Title
A MoM Based Semi-Deterministic Approach for Modelling Scattering from Building Faces
Author
Mahmood, Kashif ; Rafiq, Gulzaib ; Mughal, M. Junaid
Author_Institution
Fac. of Electron. Eng., GIK Inst. of Eng. Sci. & Technol.
fYear
2006
fDate
23-24 Dec. 2006
Firstpage
373
Lastpage
376
Abstract
The prediction accuracy of a propagation model depends on two factors; the exactness of the input data (environmental database) and the ability of the prediction tool to correctly model the available information. As the current databases used in propagation prediction tools do not provide environmental details on the wavelength scale, hence an alternate solution comprising of semi-deterministic technique is used in which walls and windows/doors in the buildings are modeled as strips and slits respectively and their distribution is treated statistically. Secondly the current favourite propagation models use ray tracing technique which becomes cumbersome when dealing with multiple interaction between large number of edges. So in order to correctly model the available information method of moments (MoM) is used which takes into account all the edges present on the building faces. Channel impulse response (CIR) for scattering from building having large scale discontinuities on its face modelled semi-deterministically was calculated using MoM. Simulated CIR was validated with the actual on sight measurements and a good agreement was found
Keywords
electromagnetic wave propagation; electromagnetic wave scattering; method of moments; ray tracing; transient response; MoM; building faces; channel impulse response; environmental database; method of moments; propagation model; propagation prediction tools; ray tracing technique; semi-deterministic approach; semideterministic technique; Accuracy; Buildings; Large-scale systems; Moment methods; Predictive models; Radio propagation; Ray tracing; Scattering; Spatial databases; Strips;
fLanguage
English
Publisher
ieee
Conference_Titel
Multitopic Conference, 2006. INMIC '06. IEEE
Conference_Location
Islamabad
Print_ISBN
1-4244-0795-8
Electronic_ISBN
1-4244-0795-8
Type
conf
DOI
10.1109/INMIC.2006.358195
Filename
4196438
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