DocumentCode :
2552664
Title :
Superscalar processor validation at the microarchitecture level
Author :
Utamaphethai, Noppanunt ; Blanton, R.D. ; Shen, John Paul
Author_Institution :
Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
fYear :
1999
fDate :
7-10 Jan 1999
Firstpage :
300
Lastpage :
305
Abstract :
We describe a rigorous ATPG-like methodology for validating the branch prediction mechanism of the PowerPC604 which can be easily generalized and made applicable to other processors. Test sequences based on finite state machine (FSM) testing are derived from small FSM-like models of the branch prediction mechanism. These sequences are translated into PowerPC instruction sequences. Simulation results show that 100% coverage of the targeted functionality is achieved using a very small number of simulation cycles. Simulation of some real programs against the same targeted functionality produces coverages that range between 34% and 75% with four orders of magnitude more cycles. We also use mutation analysis to modify some functionality of the behavioral model to further illustrate the effectiveness of our generated sequence. Simulation results show that all 54 mutants in the branch prediction functionality can be detected by measuring transition coverage
Keywords :
automatic test pattern generation; computer testing; finite state machines; integrated circuit testing; microprocessor chips; ATPG-like methodology; PowerPC instruction sequences; PowerPC604; behavioral model; branch prediction mechanism; finite state machine testing; microarchitecture level; mutation analysis; simulation cycles; superscalar processor validation; test sequences; transition coverage; Automatic test pattern generation; Computer bugs; Contracts; Current measurement; Genetic mutations; History; Microarchitecture; Power system modeling; Predictive models; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Design, 1999. Proceedings. Twelfth International Conference On
Conference_Location :
Goa
ISSN :
1063-9667
Print_ISBN :
0-7695-0013-7
Type :
conf
DOI :
10.1109/ICVD.1999.745164
Filename :
745164
Link To Document :
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