DocumentCode
2552764
Title
Noise analysis for electronic circuit using Multisim
Author
Wang, Xiu-Ling ; Zhang, Jia-Ying ; Wang, Wen-Lan ; Zhang, Xiao-Dong
Author_Institution
Coll. of Electr. Power, Inner Mongolia Univ. of Technol., Inner Mongolia, China
fYear
2010
fDate
16-18 April 2010
Firstpage
324
Lastpage
326
Abstract
Noise is electrical or electromagnetic energy that reduces the quality of a signal. Noise affects digital, analog and all communications systems. This paper introduced a noise analysis method based on Multisim. Multisim creates a noise model of the circuit, using noise models of each resistor and semiconductor device, instead of AC models, and then performs analysis. It calculates the noise contribution of each resistor and the other semiconductor device at the specified output node.
Keywords
circuit noise; flicker noise; shot noise; thermal noise; electronic circuit; multisim; noise analysis; noise contribution; noise models; resistor; semiconductor device; 1f noise; Circuit analysis; Circuit noise; Electronic circuits; Noise figure; Noise generators; Performance analysis; Resistors; Semiconductor device noise; Semiconductor devices; Multisim; model; noise analysis; noise figure; setting parameters;
fLanguage
English
Publisher
ieee
Conference_Titel
Information Management and Engineering (ICIME), 2010 The 2nd IEEE International Conference on
Conference_Location
Chengdu
Print_ISBN
978-1-4244-5263-7
Electronic_ISBN
978-1-4244-5265-1
Type
conf
DOI
10.1109/ICIME.2010.5478022
Filename
5478022
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