• DocumentCode
    2552764
  • Title

    Noise analysis for electronic circuit using Multisim

  • Author

    Wang, Xiu-Ling ; Zhang, Jia-Ying ; Wang, Wen-Lan ; Zhang, Xiao-Dong

  • Author_Institution
    Coll. of Electr. Power, Inner Mongolia Univ. of Technol., Inner Mongolia, China
  • fYear
    2010
  • fDate
    16-18 April 2010
  • Firstpage
    324
  • Lastpage
    326
  • Abstract
    Noise is electrical or electromagnetic energy that reduces the quality of a signal. Noise affects digital, analog and all communications systems. This paper introduced a noise analysis method based on Multisim. Multisim creates a noise model of the circuit, using noise models of each resistor and semiconductor device, instead of AC models, and then performs analysis. It calculates the noise contribution of each resistor and the other semiconductor device at the specified output node.
  • Keywords
    circuit noise; flicker noise; shot noise; thermal noise; electronic circuit; multisim; noise analysis; noise contribution; noise models; resistor; semiconductor device; 1f noise; Circuit analysis; Circuit noise; Electronic circuits; Noise figure; Noise generators; Performance analysis; Resistors; Semiconductor device noise; Semiconductor devices; Multisim; model; noise analysis; noise figure; setting parameters;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information Management and Engineering (ICIME), 2010 The 2nd IEEE International Conference on
  • Conference_Location
    Chengdu
  • Print_ISBN
    978-1-4244-5263-7
  • Electronic_ISBN
    978-1-4244-5265-1
  • Type

    conf

  • DOI
    10.1109/ICIME.2010.5478022
  • Filename
    5478022