• DocumentCode
    2552891
  • Title

    Design and Optimization of 40V, 0.18μm versatile HVL-DMOS device with DOE

  • Author

    Gouh, Michael Tiong Mee ; Hai, Hu Yong ; Pal, Deb Kumar ; Jian, Liu

  • Author_Institution
    X-FAB Sarawak Sdn. Bhd., Kuching
  • fYear
    2008
  • fDate
    25-27 Nov. 2008
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    In this paper, a 40 V versatile HV LDMOS technology with lower Rdson has been developed in the existing 0.18 mum LV CMOS process. The HV LDMOS are designed by using DOE concept on the simulation results from T-supreme followed by Medici. The process complexity to incorporate the HV kept as simple as possible which does not affect much due to baseline. DOE model are constructed from both the critical layout dimensions and implantation scheme. The optimized condition from DOE model provides good breakdown voltage with low Rdson, the values are BVDSS ~77 V & ~59 V; Rdson mu 84 mOmegamm2 & mu192 mOmegamm2 for n-LDMOS p-LDMOS respectively. Final tuning of the process & layout done by splits to improve the other device parameters such as leakage current, substrate current for better reliability & etc.
  • Keywords
    CMOS integrated circuits; design of experiments; leakage currents; optimisation; power MOSFET; semiconductor device breakdown; semiconductor device models; semiconductor device reliability; DOE concept; breakdown voltage; critical layout dimension; device parameters; device reliability; high voltage LDMOS device optimisation; implantation scheme; leakage current; n-LDMOS device; p-LDMOS device; size 0.18 mum; substrate current; versatile HVL-DMOS device design; voltage 40 V; CMOS process; CMOS technology; Design optimization; Doping; Integrated circuit technology; Medical simulation; Power system reliability; Silicon; US Department of Energy; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Electronics, 2008. ICSE 2008. IEEE International Conference on
  • Conference_Location
    Johor Bahru
  • Print_ISBN
    978-1-4244-3873-0
  • Electronic_ISBN
    978-1-4244-2561-7
  • Type

    conf

  • DOI
    10.1109/SMELEC.2008.4770265
  • Filename
    4770265