Secondary element patterns of array-fed imaging reflectors and their use for optimization of scanned pencil beams

Author

Cleaveland, B.

Author_Institution

GE Electron. Lab., Syracuse, NY, USA

fYear

1993

fDate

June 28 1993-July 2 1993

Firstpage

1655

Abstract

Techniques are described which provide a major improvement in the tractability of truly optimizing the complete vector pattern of array-fed Gregorian reflector systems for low sidelobe scanned beams, compared to previous scalar or ray analysis techniques. The goal was to calculate the potential for improved performance in both gain and sidelobe control, by correct choice of array excitation function in both amplitude and phase. To do this, the author sought to compute the complex secondary element patterns of each of the array elements. This makes it possible to manipulate the elemental contributions rapidly in the far field and compute the total pattern by superposition, with all amplitude and phase distortions included. For an offset geometry having a magnification of four, the secondary element patterns were evaluated for an array of 97 elements in the conjugate plane.<>

Keywords

antenna radiation patterns; directive antennas; offset reflector antennas; optimisation; reflector antenna feeds; Gregorian reflector systems; array excitation function; array-fed imaging reflectors; complex secondary element patterns; conjugate plane; far field; gain control; offset geometry; optimization; scanned pencil beams; sidelobe control; superposition; tractability; Current density; Feeds; Near-field radiation pattern; Optical arrays; Optical distortion; Optical imaging; Phase distortion; Phased arrays; Quantum computing; Vectors;

fLanguage

English

Publisher

ieee

Conference_Titel

Antennas and Propagation Society International Symposium, 1993. AP-S. Digest

Conference_Location

Ann Arbor, MI, USA

Print_ISBN

0-7803-1246-5

Type

conf

DOI

10.1109/APS.1993.385517

Filename

385517