DocumentCode :
2553232
Title :
POWERTEST: a tool for energy conscious weighted random pattern testing
Author :
Zhang, Xiaodong ; Roy, Kaushik ; Bhawmik, Sudipta
Author_Institution :
Purdue Univ., West Lafayette, IN, USA
fYear :
1999
fDate :
7-10 Jan 1999
Firstpage :
416
Lastpage :
422
Abstract :
Due to the increasing use of portable computing and wireless communications systems, energy consumption is of major concern in today´s VLSI circuits. With that in mind we present an energy conscious weighted random pattern testing technique for Built-In-Self-Test (BIST) applications. Energy consumption during BIST operation can be minimized while achieving high fault coverage. Simple measures of observability and controllability of circuit nodes are proposed based on primary input signal probability (probability that a signal is logic ONE). Such measures help determine the testability of a circuit. We developed a tool, POWERTEST, which uses a genetic algorithm based search to determine optimal weight sets (signal probabilities or input signal distribution) at primary inputs to minimize energy dissipations. The inputs conforming to the primary input weight set can be generated using cellular automata or LFSR (Linear Feedback Shift Register). We observed that a single input distribution (or weights) may not be sufficient for some random-pattern resistant circuits, while multiple distributions consume larger area. As a trade-off, two distributions have been used in our analysis. Results on ISCAS benchmark circuits show that energy reduction of up to 97.82% can be achieved (compared to equi-probable random-pattern testing with identical fault coverage) while achieving high fault coverage
Keywords :
VLSI; built-in self test; cellular automata; fault diagnosis; genetic algorithms; integrated circuit testing; logic testing; shift registers; BIST; ISCAS benchmark circuits; LFSR; POWERTEST; VLSI circuits; cellular automata; controllability; energy conscious weighted random pattern testing; energy consumption; fault coverage; genetic algorithm based search; input signal distribution; linear feedback shift register; observability; optimal weight sets; primary input signal probability; random-pattern resistant circuits; signal probabilities; Built-in self-test; Circuit faults; Circuit testing; Controllability; Energy consumption; Logic circuits; Observability; Portable computers; Very large scale integration; Wireless communication;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Design, 1999. Proceedings. Twelfth International Conference On
Conference_Location :
Goa
ISSN :
1063-9667
Print_ISBN :
0-7695-0013-7
Type :
conf
DOI :
10.1109/ICVD.1999.745191
Filename :
745191
Link To Document :
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