Title :
Modeling of fault tolerance in neural networks
Author :
Belfore, Lee A., II ; Johnson, Barry W. ; Aylor, James H.
Author_Institution :
Dept. of Electr. Eng., Virginia Univ., Charlottesville, VA, USA
Abstract :
The authors present an analytical technique for assessing the fault tolerance of neural networks. The basis of the technique is developed through an analogy with magnetic spin systems using statistical mechanics. It is shown that neural networks can be analyzed using statistical mechanics. Simulated results are compared with analytical results, showing that the analytical model does indeed conform to the simulation model. The primary example presented is an associative memory
Keywords :
neural nets; statistical mechanics; associative memory; fault tolerance; magnetic spin systems; model; neural networks; simulation; statistical mechanics; Analytical models; Biological system modeling; Fault tolerance; Intelligent networks; Machine vision; Magnetic analysis; Neural networks; Neurons; Pattern recognition; Reliability engineering;
Conference_Titel :
Industrial Electronics Society, 1989. IECON '89., 15th Annual Conference of IEEE
Conference_Location :
Philadelphia, PA
DOI :
10.1109/IECON.1989.69723