• DocumentCode
    2553368
  • Title

    Time domain scattering from arbitrary 2D scatterers obtained from frequency domain data generated numerically

  • Author

    Meyer, F.J.C. ; Davidson, D.B.

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Stellenbosch Univ., South Africa
  • fYear
    1993
  • fDate
    June 28 1993-July 2 1993
  • Firstpage
    1692
  • Abstract
    A coupled finite element/boundary element numerical method for solving 2-D scattering problems has been developed. The CEM (coupled element method) produces results from which the scattered fields from an arbitrary shaped, inhomogeneous object can be calculated for a specified frequency. The accuracy of the method has been verified over a wide frequency range, and estimates of the number of finite elements for an acceptably accurate solution, at specific frequencies, are given. A number of frequency data points can be used together with an inverse Fourier transform to obtain a simulated time-domain pulse response. The time-domain resolution and alias-free region are dependent on the frequency band and number of data points. This response enables one to investigate more carefully the scattering contribution of the different regions of a scattering object.<>
  • Keywords
    Fourier transforms; boundary-elements methods; electromagnetic wave scattering; finite element analysis; frequency-domain analysis; inverse problems; radar cross-sections; time-domain analysis; 2-D scattering problems; accuracy; alias-free region; boundary element; coupled element method; finite element; frequency domain data; inhomogeneous object; inverse Fourier transform; simulated time-domain pulse response; Africa; Boundary element methods; EMP radiation effects; Electromagnetic scattering; Finite element methods; Fourier transforms; Frequency domain analysis; Frequency estimation; Radar scattering; Time domain analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium, 1993. AP-S. Digest
  • Conference_Location
    Ann Arbor, MI, USA
  • Print_ISBN
    0-7803-1246-5
  • Type

    conf

  • DOI
    10.1109/APS.1993.385526
  • Filename
    385526