• DocumentCode
    2553563
  • Title

    Scattering from coated geometries

  • Author

    Polka, L.A. ; Balanis, C.A.

  • Author_Institution
    Dept. of Electr. Eng., Arizona State Univ., Tempe, AZ, USA
  • fYear
    1993
  • fDate
    June 28 1993-July 2 1993
  • Firstpage
    1734
  • Abstract
    The authors present simplified, computationally faster, versions of the dielectric-wedge UTD (uniform geometrical theory of diffraction) coefficients for the case of a wedge with one perfectly conducting face. Expressions for several scattering configurations are considered. Included are plane-wave incidence, far-field observation; cylindrical-wave incidence from a finite distance (/spl rho/´), far-field observation; plane-wave incidence, observation at a finite distance (/spl rho/); and surface-wave scattering with the appropriate transition terms. These variations allow one to incorporate higher-order diffraction terms into the analysis of typical, practical target geometries such as a flat plate or dihedral corner reflector. A model for predicting the RCS (radar cross section) of a flat plate coated with an electrically thin, lossy dielectric using the UTD coefficients for a coated half plane is presented.<>
  • Keywords
    electromagnetic wave scattering; geometrical theory of diffraction; radar cross-sections; RCS; UTD; coated geometries; coated half plane; cylindrical-wave incidence; dihedral corner reflector; flat plate; higher-order diffraction terms; lossy dielectric; plane-wave incidence; radar cross section; scattering configurations; surface-wave scattering; target geometries; transition terms; uniform geometrical theory of diffraction; wedge; Coatings; Computational geometry; Dielectric losses; Diffraction; Electromagnetic scattering; Radar applications; Radar cross section; Radar scattering; Surface impedance; Telecommunication computing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium, 1993. AP-S. Digest
  • Conference_Location
    Ann Arbor, MI, USA
  • Print_ISBN
    0-7803-1246-5
  • Type

    conf

  • DOI
    10.1109/APS.1993.385536
  • Filename
    385536