DocumentCode :
2553601
Title :
TM scattering by a resistive card extension to a half plane
Author :
Kempel, L.C. ; Volakis, J.L.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
fYear :
1993
fDate :
June 28 1993-July 2 1993
Firstpage :
1738
Abstract :
A characterization of scattering by a metallic half-plane loaded with a resistive strip extension is presented. The aim is to derive simple and efficient solutions not associated with extensive computational demands. Three different solution methodologies are used. The first is a moment method formulation which computes the exact current on a strip extension by utilizing the metallic half plane Green´s function. A high-frequency solution is also used which follows the formal procedure outlined by M.I. Herman and J. L. Volakis (1987), which includes up to third-order diffraction (and surface wave) contributions. Finally, an approximate low-frequency solution is developed by introducing a physical basis function for the currents. The latter two solutions are found to be complementary and a combination of them may be used in place of the rigorous numerical solution.<>
Keywords :
Green´s function methods; computational complexity; electromagnetic wave scattering; method of moments; Green´s function; TM scattering; computational demands; high-frequency solution; metallic half-plane; moment method; numerical solution; physical basis function; resistive strip extension; solution methodologies; third-order diffraction; Aerospace control; Aircraft propulsion; Apertures; Current density; Diffraction; Frequency; Laboratories; Scattering; Shape control; Strips;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Antennas and Propagation Society International Symposium, 1993. AP-S. Digest
Conference_Location :
Ann Arbor, MI, USA
Print_ISBN :
0-7803-1246-5
Type :
conf
DOI :
10.1109/APS.1993.385537
Filename :
385537
Link To Document :
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