مرکز منطقه ای اطلاع رساني علوم و فناوري - Seventh International Workshop on Microprocessor Test and Verification

DocumentCode :

2553910

Title :

Seventh International Workshop on Microprocessor Test and Verification - Cover

fYear :

2006

fDate :

4-5 Dec. 2006

Abstract :

The following topics are dealt with: microprocessor test generation; microprocessor chip verification.

Keywords :

integrated circuit testing; microprocessor chips; microprocessor chip verification; microprocessor test generation;

fLanguage :

English

Publisher :

ieee

Conference_Titel :

Microprocessor Test and Verification, 2006. MTV '06. Seventh International Workshop on

Conference_Location :

Austin, TX

ISSN :

1550-4093

Print_ISBN :

0-7695-2839-2

Type :

conf

DOI :

10.1109/MTV.2006.16

Filename :

4197207

Link To Document :