• DocumentCode
    2554093
  • Title

    Circuit Profiling Mechanisms for High-Level ATPG

  • Author

    Campos, Jorge ; Al-Asaad, Hussain

  • Author_Institution
    Univ. of California, Davis
  • fYear
    2006
  • fDate
    4-5 Dec. 2006
  • Firstpage
    9
  • Lastpage
    14
  • Abstract
    Our Mutation-based Validation Paradigm (MVP) is a validation environment for high-level microprocessor implementations. To be able to efficiently generate test sequences, we need to enable MVP´s ATPG to learn important details of the circuit under validation as a means to explore critical new circuit scenarios. In this paper, we present new profiling mechanisms that can exist either as a pre-processor that gathers circuit information prior to the circuit validation process, or as run-time entities that allow MVP to learn from its progressive experience.
  • Keywords
    automatic test pattern generation; circuit testing; high level synthesis; logic testing; microprocessor chips; ATPG; circuit profiling mechanism; high-level microprocessor; mutation-based validation paradigm; Analytical models; Automatic test pattern generation; Circuit analysis; Circuit simulation; Circuit testing; Design engineering; Hardware design languages; Microprocessors; Observability; Runtime;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microprocessor Test and Verification, 2006. MTV '06. Seventh International Workshop on
  • Conference_Location
    Austin, TX
  • ISSN
    1550-4093
  • Print_ISBN
    0-7695-2839-2
  • Type

    conf

  • DOI
    10.1109/MTV.2006.6
  • Filename
    4197216