• DocumentCode
    2554117
  • Title

    RF density-modulated electron source simulations with MICHELLE

  • Author

    Petillo, John ; Kostas, Christopher ; Panagos, Dimitrios ; Ovtchinnikov, Serguei ; Burke, Alexander ; Nelson, Eric ; Antonsen, Thomas ; Wright, Ed ; Ludeking, Lars ; Jabotinski, Vadim ; Nguyen, Khanh ; Held, Ben ; DeFord, John ; Jensen, Kevin ; Pasour, Jo

  • Author_Institution
    Science Applications Int´´l Corporation, 700 Technology Park Dr., Billerica, MA 01821, USA
  • fYear
    2012
  • fDate
    8-13 July 2012
  • Abstract
    Summary form only given. New models have been developed and implemented in the MICHELLE Finite-Element Electrostatic Particle-in-Cell code1 in support of modeling RF photocathodes and IOTs (inductive output tubes). In the case of photocatodes, low emittance, high current density sources are required to achieve the small beam size needed for high frequency vacuum electronic devices and, in particular, low emittance sources are demanded for high power free electron lasers (FELs). Emission models are of particular importance in the emittance-dominated regime, where emission non-uniformity and surface structure of the cathode can have an impact on beam characteristics and situations that depend on beam quality (e.g., halo). We have been developing comprehensive time-dependent photoemission models that account for laser and cathode material and surface characteristics and adapting them to develop emission models for inclusion into beam simulation codes2. In addition to the photoemission effects, including the effects of thermal field emission and modeling dark current are key to predicting beam quality and performance degradation due to beam tails and halo.
  • Keywords
    Adaptation models; Cathodes; Integrated circuit modeling; Laser beams; Load modeling; Radio frequency; Surface emitting lasers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma Science (ICOPS), 2012 Abstracts IEEE International Conference on
  • Conference_Location
    Edinburgh
  • ISSN
    0730-9244
  • Print_ISBN
    978-1-4577-2127-4
  • Electronic_ISBN
    0730-9244
  • Type

    conf

  • DOI
    10.1109/PLASMA.2012.6383349
  • Filename
    6383349