DocumentCode :
2554315
Title :
Diagnosing Silicon Failures Based on Functional Test Patterns
Author :
Yen, Chia-Chih ; Ten Lin ; Lin, Huiming ; Yang, Kai ; Liu, Tayung ; Hsu, Yu-Chin
Author_Institution :
Springsoft Inc., Hsinchu
fYear :
2006
fDate :
4-5 Dec. 2006
Firstpage :
94
Lastpage :
98
Abstract :
Identifying the root-cause of silicon failures is crucial for silicon debug and yield improvement. However, due to the low visibility of silicon data, root-cause identification tends to be a painful process. In this paper, we develop a systematic framework to diagnose silicon failures under functional test patterns. We propose a novel scan-dump approach to isolate critical cycles. Within the critical cycles, we apply logic-reasoning techniques including active-path-tracing (AP) and what-if (WI) analysis to automatically extract and rank failure candidates. We apply our framework on an industrial circuit and demonstrate the promising results.
Keywords :
computer debugging; reasoning about programs; silicon; system recovery; active-path-tracing; functional test patterns; logic reasoning; scan-dump approach; silicon debug; silicon failures diagnosis; what-if analysis; Circuit testing; Clocks; Data engineering; Design engineering; Design for disassembly; Failure analysis; Fault diagnosis; Silicon; Software performance; Software testing; Silicon debug; design for debug; fault diagnosis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microprocessor Test and Verification, 2006. MTV '06. Seventh International Workshop on
Conference_Location :
Austin, TX
ISSN :
1550-4093
Print_ISBN :
0-7695-2839-2
Type :
conf
DOI :
10.1109/MTV.2006.9
Filename :
4197228
Link To Document :
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