• DocumentCode
    2554472
  • Title

    Noise in reconstructed images in tomography parallel, fan and cone beam projections

  • Author

    Hiriyannaiah, Harish P. ; Snyder, Wesley E. ; Bilbro, Griff L.

  • Author_Institution
    Center for Commun. & Signal Process., North Carolina State Univ., Raleigh, NC, USA
  • fYear
    1990
  • fDate
    3-6 Jun 1990
  • Firstpage
    81
  • Lastpage
    88
  • Abstract
    A principle source of noise in X-ray and emission computer tomography is at the detectors that measure the projection of the object. The noise can be approximated by additive, signal-independent white Gaussian statistics by ignoring the negligible effects of scattering and diffraction of the source beam. The back-projection filter that is used significantly alters power spectral density of the noise, such that the back-projected noise at each reconstructed point is no longer white. However, to effectively restore the reconstructed image using maximum a posteriori techniques via mean field annealing (MFA), a reasonable estimate of the autocorrelation of the back-projected noise is necessary. This work derives the autocorrelation and power spectra of the reconstructed noise for parallel, fan, and cone beam projections and also shows some preliminary results of MFA restorations
  • Keywords
    computerised tomography; noise; radioisotope scanning and imaging; X-ray tomography; autocorrelation spectra; back-projected noise autocorrelation; cone beam projection; diffraction; emission computer tomography; fan projection; maximum a posteriori techniques; mean field annealing; parallel projection; power spectral density; reconstructed images; scattering; signal-independent white Gaussian statistics; Autocorrelation; Gaussian noise; Image reconstruction; Image restoration; Noise measurement; Object detection; Tomography; X-ray detection; X-ray detectors; X-ray imaging;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer-Based Medical Systems, 1990., Proceedings of Third Annual IEEE Symposium on
  • Conference_Location
    Chapel Hill, NC
  • Print_ISBN
    0-8186-9040-2
  • Type

    conf

  • DOI
    10.1109/CBMSYS.1990.109382
  • Filename
    109382