Title :
Enhanced terahertz detection using multiple GaAs HEMTs connected in series
Author :
Elkhatib, Tamer A. ; Veksler, Dmitry B. ; Salama, Khaled N. ; Zhang, Xi-C ; Shur, Michael S.
Author_Institution :
Center for Terahertz Res., Rensselaer Polytech. Inst., Troy, NY, USA
Abstract :
We report here, for the first time, on enhanced nonresonant detection of terahertz radiation using multiple InGaAs/GaAs high-electron-mobility transistors (HEMTs) connected in series and biased by a direct drain current. A 1.63 THz (184 mum) response is proportional to the number of detecting transistors operating in saturation region at the same gate-source bias voltage. The experimental data are in agreement with the detection mechanism based on the rectification of overdamped plasma waves excited by radiation in channels of devices.
Keywords :
III-V semiconductors; arsenic compounds; gallium compounds; high electron mobility transistors; terahertz waves; InGaAs-GaAs; direct drain current; frequency 1.63 THz; gate-source bias voltage; high-electron-mobility transistor; multiple GaAs HEMT; terahertz radiation detection; Gallium arsenide; Gas lasers; HEMTs; Indium gallium arsenide; MODFETs; Optical imaging; Plasma waves; Radiation detectors; Submillimeter wave technology; Testing; GaAs HEMTs; plasma waves; room temperature; series transistors; short channel; terahertz detection;
Conference_Titel :
Microwave Symposium Digest, 2009. MTT '09. IEEE MTT-S International
Conference_Location :
Boston, MA
Print_ISBN :
978-1-4244-2803-8
Electronic_ISBN :
0149-645X
DOI :
10.1109/MWSYM.2009.5165852