DocumentCode
2554557
Title
A six-port reflectometer for in-situ monitoring of frequency multipliers
Author
Wu, Guoguang ; Xu, Haiyong ; Hesler, Jeffrey L. ; Lichtenberger, Arthur W. ; Weikle, Robert M.
Author_Institution
Dept. of Phys., Univ. of Virginia, Charlottesville, VA, USA
fYear
2009
fDate
7-12 June 2009
Firstpage
945
Lastpage
948
Abstract
This paper describes a waveguide-based reflectometer designed for in-situ measurement and monitoring of the return loss between adjacent stages in a frequency multiplier chain. The reflectometer is based on a six-port architecture and a prototype instrument operating at V-band (50-75 GHz) is introduced. An in-situ calibration method based on null double injection is discussed and initial measurements to assess the performance of the prototype are presented.
Keywords
frequency multipliers; optical waveguides; reflectometers; V-band; frequency 50 MHz to 75 MHz; frequency multipliers; in-situ monitoring; optical waveguide; six-port reflectometer; Calibration; Circuits; Detectors; Electromagnetic waveguides; Frequency; Impedance measurement; Monitoring; Probes; Prototypes; Schottky diodes; Six-port reflectometer; WR15; frequency multiplier; null double injection;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 2009. MTT '09. IEEE MTT-S International
Conference_Location
Boston, MA
ISSN
0149-645X
Print_ISBN
978-1-4244-2803-8
Electronic_ISBN
0149-645X
Type
conf
DOI
10.1109/MWSYM.2009.5165854
Filename
5165854
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