• DocumentCode
    2554678
  • Title

    The effect of clean and no-clean flux in enhancing the wettability of eutectic solder bump flip chip PBGA

  • Author

    Amin, Nowshad ; Cheah, Ang Ye ; Kornain, Zainudin ; Ahmad, Ibrahim

  • Author_Institution
    Dept. of Electr. Electron. & Syst. Eng., Univ. Kebangsaan Malaysia, Bangi
  • fYear
    2008
  • fDate
    25-27 Nov. 2008
  • Firstpage
    388
  • Lastpage
    392
  • Abstract
    Five different types of clean flux and no-clean flux, which are mainly used in flip chip die attach, have been analyzed in respect to the wettability of eutectic solder bump in flip chip PBGA. An experimental study is carried out to measure the spreading area of the eutectic solder bump processed with different types of flux. Various types of clean and no-clean flux are measured and placed on top of silicon die. The effect of the flux has been observed by measuring the spreading area of the eutectic solder bump processed with different types of clean and no-clean fluxes by using Leica Quin Colour (RGB) after the heat treatment. Comparative studies on clean and no-clean fluxes are therefore obtained. Clean flux has shown better wettability on the high lead solder pad proving it to be the optimum choice as also supported by the die pull results. Moreover, the fluxes are tested under thermal gravimetric analyzer (TGA) to observe the flux weight loss on the melting point of eutectic solder bump to correlate with the earlier results.
  • Keywords
    ball grid arrays; elemental semiconductors; eutectic alloys; flip-chip devices; heat treatment; microassembling; reflow soldering; silicon; thermal analysis; wetting; Leica Quin Colour; PBGA; TGA; eutectic solder bump; eutectic solder bump flip chip; flux weight loss; heat treatment; high lead solder pad; melting point; silicon die; thermal gravimetric analyzer; wettability; Area measurement; Flip chip; Lead; Microassembly; Semiconductor device measurement; Soldering; Solids; Solvents; Temperature; Viscosity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Electronics, 2008. ICSE 2008. IEEE International Conference on
  • Conference_Location
    Johor Bahru
  • Print_ISBN
    978-1-4244-3873-0
  • Electronic_ISBN
    978-1-4244-2561-7
  • Type

    conf

  • DOI
    10.1109/SMELEC.2008.4770347
  • Filename
    4770347