DocumentCode
255485
Title
Extended feature extraction technique from fingerprint
Author
Swain, S. ; Majhi, B. ; Dash, R.
Author_Institution
Dept. of Comput. Sci., NIT Rourkela, Rourkela, India
fYear
2014
fDate
11-13 Dec. 2014
Firstpage
1
Lastpage
5
Abstract
Automated Fingerprint Identification Systems (AFIS) currently rely only on Level 1 and Level 2 features. But these features are not much helpful for forensic experts as the experiment deals with partial to full print matching of latent fingerprint. Forensic experts takes the advantage of extended feature proposed by “Committee to Define an Extended Fingerprint Feature Set” (CDEFFS). This paper presents extraction technique of two extended features, dots and incipient ridges by tracing valleys. We have found starting points on the valley by analyzing the frequencies present in the fingerprint. Valley are traced from the starting point using first marching method ( FMM ). Then an intensity checking method is used for finding these features. Extensive simulation is carried out in MATLAB environment to show the superiority of the proposed feature extraction technique over state of art. Accuracy of the proposed feature extraction scheme also has been shown using special database 30 and IIIT Delhi database.
Keywords
feature extraction; fingerprint identification; image matching; AFIS; FMM; IIIT Delhi database; Matlab environment; automated fingerprint identification systems; extended feature extraction technique; first marching method; incipient ridges; intensity checking method; latent fingerprint matching; Databases; Entropy; Equations; Feature extraction; Fingerprint recognition; Level set; NIST; dots and incipient; extended feature; fingerprint; level 3 feature;
fLanguage
English
Publisher
ieee
Conference_Titel
India Conference (INDICON), 2014 Annual IEEE
Conference_Location
Pune
Print_ISBN
978-1-4799-5362-2
Type
conf
DOI
10.1109/INDICON.2014.7030491
Filename
7030491
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